diffractometry: Baseline identification and peak decomposition for x-ray diffractograms

Residual-based baseline identification and peak decomposition for x-ray diffractograms as introduced in Davies/Gather/Mergel/Meise/Mildenberger (2008).

Version: 0.1-8
Published: 2013-12-11
Author: P.L. Davies, U. Gather, M. Meise, D.Mergel, T. Mildenberger. Additional Code by T. Bernholt and T. Hofmeister
Maintainer: T. Mildenberger <mild at zhaw.ch>
License: GPL-2 | GPL-3 [expanded from: GPL (≥ 2)]
NeedsCompilation: yes
In views: ChemPhys
CRAN checks: diffractometry results

Downloads:

Reference manual: diffractometry.pdf
Package source: diffractometry_0.1-8.tar.gz
Windows binaries: r-devel: diffractometry_0.1-8.zip, r-release: diffractometry_0.1-8.zip, r-oldrel: diffractometry_0.1-8.zip
OS X Snow Leopard binaries: r-release: diffractometry_0.1-8.tgz, r-oldrel: diffractometry_0.1-8.tgz
OS X Mavericks binaries: r-release: diffractometry_0.1-8.tgz
Old sources: diffractometry archive