Residual-based baseline identification and peak decomposition for x-ray diffractograms as introduced in Davies/Gather/Mergel/Meise/Mildenberger (2008).
| Version: | 0.1-03 |
| Published: | 2011-03-11 |
| Author: | P.L. Davies, U. Gather, M. Meise, D.Mergel, T. Mildenberger. Additional Code by T. Bernholt and T. Hofmeister |
| Maintainer: | T. Mildenberger <thoralf.mildenberger at uni-bayreuth.de> |
| License: | GPL (≥ 2) |
| In views: | ChemPhys |
| CRAN checks: | diffractometry results |
| Package source: | diffractometry_0.1-03.tar.gz |
| MacOS X binary: | diffractometry_0.1-03.tgz |
| Windows binary: | diffractometry_0.1-03.zip |
| Reference manual: | diffractometry.pdf |
| Old sources: | diffractometry archive |