diffractometry: Baseline identification and peak decomposition for x-ray diffractograms

Residual-based baseline identification and peak decomposition for x-ray diffractograms as introduced in Davies/Gather/Mergel/Meise/Mildenberger (2008).

Version: 0.1-8
Published: 2013-12-11
Author: P.L. Davies, U. Gather, M. Meise, D.Mergel, T. Mildenberger. Additional Code by T. Bernholt and T. Hofmeister
Maintainer: T. Mildenberger <mild at zhaw.ch>
License: GPL-2 | GPL-3 [expanded from: GPL (≥ 2)]
NeedsCompilation: yes
In views: ChemPhys
CRAN checks: diffractometry results

Downloads:

Reference manual: diffractometry.pdf
Package source: diffractometry_0.1-8.tar.gz
OS X binary: diffractometry_0.1-8.tgz
Windows binary: diffractometry_0.1-8.zip
Old sources: diffractometry archive